Nano-Observer
Atomic Force Microscopy Systems
Both, the Nano-Observer I and Nano-Observer II represent a comprehensive AFM solution, providing researchers with the tools they need for foundational and frontier research in nanoscience and materials characterization.
Nano-Observer II
We are proud to introduce the Nano-Observer II—our next-generation AFM designed for specialized and more advanced research applications. The Nano-Observer II incorporates cutting-edge features that push the boundaries of AFM technology, offering enhanced capabilities for researchers who require the highest levels of precision and functionality. Whether you're exploring new materials, conducting high-resolution imaging, or engaging in complex nanomechanical studies, the Nano-Observer II is engineered to meet the most demanding scientific challenges.
Nano-Observer One Plus
​For years, the Nano-Observer One Plus has been the cornerstone of CSInstruments' AFM offerings, trusted by researchers across various fields for its reliability, precision, and versatility. It remains an advanced solution for a wide range of applications, combining robust performance with ease of use. This powerful tool continues to serve as a go-to option for researchers looking to achieve detailed and accurate surface characterization.
Galaxy Dual Controller
The Galaxy Dual Controller represents a significant leap forward in AFM technology, offering a unique solution to revitalize and expand the capabilities of existing AFM systems. Designed with versatility and innovation in mind, this advanced controller breathes new life into Multimode, 5100, and 5500 AFM setups. By seamlessly integrating cutting-edge features with your current hardware, the Galaxy Dual Controller opens up a world of new research possibilities without the need for a complete system overhaul.