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Abstract Linear Background

The New

Nano-Observer II

All-in-one AFM

with advanced

scan modes

Nano-Observer II

Nano-Observer
Atomic Force Microscopy Systems

Both, the Nano-Observer I and Nano-Observer II represent a comprehensive AFM solution, providing researchers with the tools they need for foundational and frontier research in nanoscience and materials characterization.

CSInstruments - About Us

Our References

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CNRS
IBM
Total Energies
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