Advanced Atomic Force Microscopy Systems by CSInstruments

The next generation of high-performance AFM. Engineered for advanced applications demanding the highest precision & high-resolution imaging, complex nanomechanical analysis, and frontier materials research.

Reliable choice for everyday surface characterization. Versatile and built for daily use across a wide range of surface characterization applications, without sacrificing precision.

Don't replace your AFM: upgrade it. The Galaxy Dual Controller brings cutting-edge capabilities to existing Multimode, Dimension, Agilent and Keysight systems unlocking new research possibilities without a full hardware overhaul.