ResiScope™ II is an advanced module for Atomic Force Microscopy (AFM) that enables high-precision electrical measurements at the nanoscale. Here's an overview of its working principle:

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Conductive Probe:

• A conductive AFM tip scans the sample surface

• Tip acts as one electrode, sample as the other

Voltage Application:

• DC bias voltage applied between tip and sample

Current Measurement:

• Measures current flowing between tip and sample

• Current range: 50 fA to 1 mA

Resistance Calculation:

• Calculates local resistance using applied voltage and measured current

• Resistance range: 100 ohms to 1 Tohm

Fast Auto-Ranging:

• Processor-driven auto-ranging for real-time measurement adjustments

• No manual intervention needed

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The unique design of ResiScope III allows for unprecedented sensitivity and range in electrical measurements, making it a powerful tool for nanoscale electrical characterization across a wide range of materials and applications.

ResiScope II vs. C-AFM

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• Enhanced Visualization: Superior imaging of highly conductive areas

• Artifact Elimination: Avoids slope effects from surface charging

• Wider Measurement Range: 10-decade bandwidth for precise measurements

• Consistent Performance: Reliable results without capacitive discharge effects

• Comprehensive Characterization: High sensitivity for thorough electrical analysis

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While traditional C-AFM remains a useful technique, ResiScope III represents a significant advancement in nanoscale electrical characterization, offering greater range, precision, and versatility for cutting-edge research and analysis.