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Soft ResiScope™
True Quantitative Resistance/Current Measurements with Intermittent Contact
Soft ResiScope™ is an innovative AFM mode that enables true quantitative resistance and current measurements on soft and fragile conductive samples. This unique technology combines the benefits of intermittent contact modes with the precision of ResiScope measurements, opening new possibilities for electrical characterization of sensitive materials.
Key Features
Non-Destructive Measurements:
Ideal for fragile and soft conductive samples
Wide Measurement Range:
Resistance from 10² to 10¹² ohms
No Friction:
Prevents sample damage and tip wear
Constant Force:
Ensures quantitative electrical measurements
Intermittent Contact:
Optimizes electrical measurement while preserving tip and sample integrity
VO² sample, 10µm, Topography and resistance signals
P3HT (Organic PV cell)
3 μm scan
Oxide film grown on stainless steel Scan Size:1x1 micron
Doping test sample used by semiconductor industry to improve doping concentration process.
Sample: Polymer Battery Scan size: 80 microns
Sample: Sram 50 microns
Perovskite Solar cell (2µm scan)
Graphene oxide on Gold substrate
Soft Intermittent Contact : The 3rd AFM mode
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Combines precision of contact AFM with dynamic capabilities of resonant modes
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Ideal for delicate and soft materials
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Detailed mechanical and electrical measurements with minimal sample disturbance
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Soft Meka, Soft PFM, Soft ResiScope and Soft SThM
Soft IC Mode
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Adhesion
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Stiffness
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Young’s Modulus
Soft Intermittent Contact : The 3rd AFM mode
-
Combines precision of contact AFM with dynamic capabilities of resonant modes
-
Ideal for delicate and soft materials
-
Detailed mechanical and electrical measurements with minimal sample disturbance
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Soft Meka, Soft PFM, Soft ResiScope and Soft SThM
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Integrates intermittent contact AFM with detailed resistance and current mapping
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Wide range of resistance measurements (10² to 10¹² ohms)
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Excellent for fragile conductive samples and advanced material studies
Quantitative Measurements
Ultrathin granular gold layer evaporated on a doped-Si substrate
Resistance signal,
5μm scan
Soft ResiScope provides quantitative measurements comparable to standard ResiScope in contact mode:
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Identical Results: Topography and resistance signals match between Soft ResiScope and contact mode ResiScope on standard electrical samples (e.g., SRAM)
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High Resolution: Maintains lateral resolution while ensuring quantitative measurements
Advantages Over Traditional Methods
Soft ResiScope vs. Standard ResiScope
Soft ResiScope vs. Oscillating/Contact Modes
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Sample Preservation: Prevents surface damage common in contact mode
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Equivalent Results: Produces data comparable to oscillating mode on fragile samples
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Versatility: Suitable for a wide range of materials, from polymers to biological samples