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PS/PMMA image 5x5 micron​
Force Modulation Mode
Mechanical Property Mapping with Precision
Force Modulation Mode is an advanced Atomic Force Microscopy (AFM) technique designed to map material properties like stiffness and elasticity at the nanoscale. By applying a periodic force to the sample, this mode enables the visualization of mechanical variations in complex materials, making it ideal for polymers, composites, and nanostructures.
Key Features
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Mechanical Property Imaging: Map stiffness, elasticity, and viscoelastic behavior with high resolution.
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Nanoscale Sensitivity: Detect subtle mechanical variations at the sub-nanometer scale.
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Wide Applicability: Suitable for hard and soft materials in diverse environments.
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Non-Destructive Testing: Perfect for delicate samples like biological tissues and thin films.
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Multimodal Compatibility: Combine with other AFM modes for comprehensive analysis.
Topography image of
Block Polymer
Scan size 50 µm x 50 µm
Force Modulation Mode
Block Polymer
Scan size 50 µm x 50 µm
Applications of Force Modulation Mode
Polymers and Nanocomposites
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Map stiffness and elasticity variations in polymer blends.
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Analyze nanoscale heterogeneity in composite materials.
Thin Films and Coatings
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Measure mechanical properties of thin films without damaging the surface.
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Evaluate adhesion and elasticity in functional coatings.
Biological Samples
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Characterize the mechanical behavior of cells and tissues.
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Investigate biomaterial elasticity for medical applications.