Our Nano-Observer AFM series is a cutting-edge solution for the analysis of 2D materials like graphene, hBN, and transition metal dichalcogenides. It offers unparalleled precision in characterizing surface morphology, mechanical properties, and electrical behavior at the nanoscale. With advanced modes such as HD-KFM III and ResiScope, it enables detailed investigations of these materials' unique properties, supporting both fundamental research and industrial development in nanotechnology and advanced material applications.