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Contact Mode
Fundamental Imaging for Nanoscale Discovery
Contact Mode is one of the foundational techniques in Atomic Force Microscopy (AFM), offering high-resolution imaging and force measurement capabilities. In this mode, a nanometric probe maintains constant contact with the sample surface, providing direct topographical information and friction data.
Key Features
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High Resolution: Achieve atomic-scale imaging on suitable samples.
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Direct Force Measurement: Quantitative analysis of tip-sample interactions.
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Versatility: Compatible with various sample types and environments.
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Simultaneous Data Acquisition: Collect topography and friction data in a single scan.
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Established Technique: Well-understood methodology with extensive literature support.
Contact Mode AFM
Force Curves
Perform precise force-distance measurements to study:
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Adhesion forces
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Material elasticity
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Surface energy
Friction Analysis
Utilize Lateral Force Microscopy (LFM) to investigate:
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Nanoscale tribology
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Surface lubrication
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Material homogeneity
Environmental Control
Conduct experiments in various conditions:
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Controlled atmosphere
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Liquid environments
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Temperature variations
Fibre Sample
Hexagonal Structures
Si Sample
Si Sample