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The 3rd AFM mode
Soft Intermittent Contact Mode
Precision for Delicate Samples
Soft Intermittent Contact (Soft IC) Mode combines the advantages of Resonant Mode and Contact Mode in a single solution. This innovative technique provides accurate topography measurements while protecting both sample and tip from damage.
Key Features
Optimal Measurement Control
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Simple force control using single parameter (deflection)
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Straightforward force calculation using Hooke's law
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Precise topography measurements
Soft IC - Resonant Mode Advantages:
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Eliminates friction and shear forces
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Reduces sample damage
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Minimizes tip wear
Soft IC - Contact Mode Benefits:
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Direct force control
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Simple force calculation
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Straightforward operation
Advantages Over Traditional Methods
SOFT IC Compared to Contact Mode:
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Eliminates lateral forces
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Reduces sample damage
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Extends tip lifetime
SOFT IC Compared to Resonant Mode
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Simpler force control (single parameter)
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Direct force calculation
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More straightforward operation
Nanotubes on Polymer
Semiconductors
Renewable Energy
2D Materials
Soft Intermittent Contact : The 3rd AFM mode
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Combines precision of contact AFM with dynamic capabilities of resonant modes
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Ideal for delicate and soft materials
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Detailed mechanical and electrical measurements with minimal sample disturbance
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Soft Meka, Soft PFM, Soft ResiScope and Soft SThM
Soft MEKA
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Extension of Soft IC mode for precise mechanical property measurements
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High-resolution mapping of stiffness and adhesion
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Particularly useful for soft or fragile samples
Soft IC Mode
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Adhesion
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Stiffness
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Young’s Modulus
Soft ResiScope
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Integrates intermittent contact AFM with detailed resistance and current mapping
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Wide range of resistance measurements (10² to 10¹² ohms)
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Excellent for fragile conductive samples and advanced material studies
Quantitative Measurements
Ultrathin granular gold layer evaporated on a doped-Si substrate
Resistance signal,
5μm scan
Soft ResiScope provides quantitative measurements comparable to standard ResiScope in contact mode:
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Identical Results: Topography and resistance signals match between Soft ResiScope and contact mode ResiScope on standard electrical samples (e.g., SRAM)
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High Resolution: Maintains lateral resolution while ensuring quantitative measurements
Advantages Over Traditional Methods
Soft ResiScope vs. Oscillating/Contact Modes
Soft ResiScope vs. Oscillating/Contact Modes
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Sample Preservation: Prevents surface damage common in contact mode
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Equivalent Results: Produces data comparable to oscillating mode on fragile samples
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Versatility: Suitable for a wide range of materials, from polymers to biological samples