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Lateral Force Microscopy (LFM)
Mapping Surface Friction with Precision
Lateral Force Microscopy (LFM) is a specialized Atomic Force Microscopy (AFM) mode for measuring surface friction and detecting nanomechanical variations. By analyzing lateral deflections of the AFM probe, LFM provides detailed insights into frictional forces and material heterogeneity, making it ideal for tribology, materials science, and nanotechnology applications.
Key Features
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Friction Mapping: Quantify nanoscale variations in surface friction with high sensitivity.
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High Resolution: Achieve sub-nanometer spatial resolution.
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Versatility: Suitable for hard and soft materials in ambient or controlled environments.
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Simultaneous Data Collection: Combine with topography for correlated analysis.
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Wide Applicability: Analyze polymers, composites, coatings, and biological samples.
Two AFM images of the same graphene spot compare surface morphology (topography - left) and material interactions (friction mode - right), highlighting nanoscale structural and frictional variations.
Applications of Lateral Force Microscopy
Tribology Studies
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Investigate surface lubrication and wear properties.
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Analyze frictional behavior of functional coatings and films.
Materials Science
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Map heterogeneity in composite materials and polymers.
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Study phase separation and nanoscale frictional variations.
Biological Samples
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Examine frictional forces in biomaterials and tissues.
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Characterize the surface properties of biological samples.