Welcome to CSInstruments AFM Applications & Scan Results, where we present detailed Atomic Force Microscopy (AFM) scans from key fields such as Energy Materials, 2D Materials, Semiconductors, Biological Samples, Polymers, and Nanomaterials. Each scan, captured using our advanced Nano-Observer series, provides precise data on surface topography, electrical properties, and mechanical characteristics at the nanoscale. Our results showcase the high-quality measurements and reliable solutions we offer to support research and industry applications.