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EZ Temperature: Precision Thermal Control
Advanced Temperature-Controlled AFM Measurements
The EZ Temperature accessory, developed by CSInstruments for the Nano-Observer AFM, delivers precise temperature control and stable imaging during temperature changes. This powerful addition to your AFM setup opens new possibilities for studying temperature-dependent phenomena at the nanoscale.
Key Features
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Wide Temperature Range: From -40°C to 300°C
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Compatibility: Works with all AFM modes
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Minimal Thermal Drift: Optimized design reduces temperature gradients
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Stable Imaging: Maintain high-quality scans during temperature changes
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Versatile Applications: Ideal for polymers, materials science, and biological samples
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Seamless Integration: Designed specifically for the Nano-Observer AFM
Benefits of EZ Temperature Module
Temperature : 70°C to 40°C
Resonant mode
PCL (polycaprolactone) crystallization under controlled temperature
Scan size : 20µm
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Limited Thermal Expansion: Minimized drift for stable imaging
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Low Temperature Capability: Expand your research with different temperature conditions
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Thermal Insulation: Protect sensitive AFM components
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Precise Temperature Control: Achieve accurate and reproducible thermal conditions
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Real-Time Imaging: Observe dynamic processes during temperature changes
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Versatile Compatibility: Works with various modes and environmental controls
Real time aquisition, Polymer cystallization 10 µm