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Applications Notes
Welcome to the CSInstruments Application Notes library, your resource for advanced nanoscale characterization. This collection features in-depth case studies demonstrating how our Nano-Observer AFM series tackles today's most pressing research challenges. Explore key fields including Energy Materials, 2D Materials, Semiconductors, Polymers, and Biological Samples. Each note is a practical guide, showing how to obtain a complete picture of your sample by correlating surface topography with critical electrical and mechanical properties. Dive in to find solutions and inspiration for your own research.
Discover how to overcome the limitations of conventional AFM in solar cell research. This application note details how HD-KFM™, ResiScope™, and Soft IC™ modes provide a complete solution for artifact-free conductivity mapping, high-resolution surface potential analysis, and non-destructive characterization.
Nanoscale Electrical Characterization of Photovoltaic Materials
This note details how to overcome the limitations of conventional AFM for characterizing solid-state polymer batteries. Learn how the synergistic combination of Soft ResiScope™ and HD-KFM™ provides a complete, non-destructive analysis of critical electrical properties.
Unlocking Solid-State Battery Performance with ResiScope™ & HD-KFM™
Explore how HD-KFM and ResiScope™ on the Nano-Observer AFM reveal layer-dependent work function, moiré superlattice charge modulation, and conductivity in graphene, hBN, and MoS₂ — from ~100 nm triangular domains to monolayer-by-monolayer electronic structure mapping.
2D Materials:
Graphene, hBN & MoS₂