Applications Notes

Discover how to overcome the limitations of conventional AFM in solar cell research. This application note details how HD-KFM™, ResiScope™, and Soft IC™ modes provide a complete solution for artifact-free conductivity mapping, high-resolution surface potential analysis, and non-destructive characterization of delicate organic and perovskite materials.

This note details how to overcome the limitations of conventional AFM for characterizing solid-state polymer batteries. Learn how the synergistic combination of Soft ResiScope™ and HD-KFM™ provides a complete, non-destructive analysis of critical electrical properties. We demonstrate how to simultaneously map topography, resistance, current distribution, and surface potential to accelerate the development of next-generation energy storage.

This application note details the principles of High-Definition Kelvin Force Microscopy (HD-KFM™ III) for advanced nanoscale electrical characterization. Discover how its unique multifrequency, single-pass design achieves exceptional sensitivity and resolution in surface potential mapping. The note showcases a wide range of applications, including the analysis of moiré patterns in 2D materials, the characterization of solar cells, and the inspection of semiconductor devices.

This application note introduces the ResiScope™ III, a state-of-the-art module that overcomes the limitations of conventional Conductive AFM (C-AFM). Learn how its intelligent, DSP-controlled auto-ranging technology provides artifact-free electrical measurements across an unparalleled 10-decade dynamic range. Discover applications in semiconductors, solar cells, and 2D materials where precise, high-resolution conductivity mapping is critical.