.png)
Environmental Control for Atomic Force Microscopy
Precision Measurements in Controlled Atmospheres
Environmental control is crucial for obtaining accurate, reproducible results in advanced Atomic Force Microscopy (AFM) applications. CSInstruments' Atmosphere Control accessory for the Nano-Observer AFM allows researchers to conduct experiments in precisely controlled environments, opening new possibilities for materials characterization and nanoscale studies.
Key Features
-
Isolated Chamber: Create a controlled volume around the AFM setup
-
Gas Control: Introduce inert gases or control atmospheric composition
-
Humidity Regulation: Precise control of relative humidity (RH) from near 0% to high levels
-
Rapid Response: Fast and accurate changes in environmental conditions
-
Compact Design: Small chamber volume for quick equilibration
-
Software Integration: Seamless control through the Nano-Observer AFM interface
HD-KFM on HOPG, Humidity Control (70%), effect over the time, 30μm scan
Why Choose CSInstruments for Environmental Control?
-
Integrated Solution: Designed specifically for the Nano-Observer AFM
-
Versatility: Compatible with a wide range of AFM modes and applications
-
Precision: Achieve reproducible results in controlled atmospheres
-
User-Friendly: Easy to set up and operate through intuitive software
-
Expert Support: Our team provides guidance for optimal environmental control in your research