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Nano-Observer II
Advanced, Versatile Atomic Force Microscope
The Nano-Observer II is a cutting-edge Atomic Force Microscope (AFM) that combines flexibility, exceptional performance, and user-friendly operation. Designed for both advanced users and beginners, it offers a wide range of capabilities for nanoscale imaging and characterization.
Key Features
User-Friendly Design
- Top and side views of the tip/sample area for efficient pre-approach process
- Compact AFM head with optional Pre-Alignment tip/laser holder
AutoScan Software: Easier & Faster Automated Scan
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Auto approach (automated fast and gentle final approach)
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Autogain: realtime active AFM feedback gains
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Setpoint conditions: preset Setpoints
(For Soft, Medium or Hard interaction)
High-Performance Scanning
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Low-noise, high-resolution scanning capabilities
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Large-small area scans without changing scan head
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Consistent resolution across all scan sizes
Advanced AFM Modes
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Hydroxyphthioceranic acid (C36)
Scan size 250x250 nm
Real-time video on our YouTube video: Click Here
AFM + optical coupling
The Nano-Observer II has an open design for integration of optical microscopy techniques (UV, IR, Raman, etc.), enabling enhanced light illumination for photovoltaic illumination.
Advanced Technology Integration
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The New Galaxy USB 24-bit low noise AFM controller
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High quality built in lock-ins
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Phase, PFM, EFM, KFM...
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Key modes: HD-KFM and ResiScope for high-resolution imaging
AFM + Glove box
Exploring the properties of various materials often necessitates a controlled environment. A glove box ensures precise control of humidity or gas (e.g., Nâ‚‚, Ar), safeguarding sensitive samples—such as 2D materials, lithium, organic, or photovoltaic materials—from environmental influences.
Various Application Fields
With Different Scan Modes
RESISCOPE : CURRENT & RESISTANCE MAPPING
WHAT IS RESISCOPE ?
The ResiScope is a unique, true active and fast system able to measure Resistance over 10 decades with a high sensitivity and resolution. True fast auto ranging driven by Digital Signal Processor (DSP). It can be combined with several dynamic modes as MFM/EFM or KFM single pass providing several sample characterizations on the same scan area.
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Resistance & Current mapping over 10 orders of magnitude in one module and one pass
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Current control
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High sensitivity over the full range
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Compatible with :
Oscillating mode / AC mode
EFM / MFM
HD-KFM
HD-KFM - High Definition Kelvin Force Microscopy
In addition to standard KFM, the Nano-Observer II can offer High Definition KFM mode to highly enhance the resolution and increase the sensitivity of the surface potential.
The Electric Field Cancelling is a technique to compensate in real time the electrostatic field between the tip and the sample to achieve a pure magnetic measurement (MFM)
HD-KFM with EFC mode
Magnetic particles embedded in polymer
30x30µm Scan​
Soft Intermittent-Contact Mode (Soft-IC) The 3rd AFM mode
Advanced Surface Characterization
A Breakthrough in AFM Technology for Comprehensive Sample Analysis
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The Soft-IC mode operates at lower frequencies than traditional AFM, allowing the probe tip to make controlled, intermittent contact with the sample surface. This precise Z-piezo movement maintains constant force during measurement before retracting to the next point, enabling accurate mechanical and electrical property measurements while minimizing sample damage. By combining the advantages of both contact and resonant AFM modes, Soft-IC excels at characterizing soft biological samples and abrasive materials without compromising measurement quality or sample integrity. Compatible with various probe tips, this versatile technique delivers quantitative data while protecting both sample and probe.
Soft MEKA (Soft IC + Mechanical measurement)
Soft Meka allows to obtain high resolution imaging of stiffness or adhesion. By setting a lift height higher than the adhesion force, tip can be totally disengaged from the surface and permit to obtain stiffness and adhesion from every measured point. In addition, the stiffness can be used in combination with a software module to calculate the Young modulus
Soft IC + Resiscope = Soft Resiscope
The Soft ResiScope is a specialized AFM technique engineered for precise electrical characterization of fragile conductive samples. During operation, the system executes controlled vertical movement and keeps the force constant during the current/resistance measurement so that a quantitative conductive measurement is performed. Unlike traditional contact mode ResiScope, the Soft ResiScope measures also quantitatively resistance and current, avoiding the effects of friction either on the tip or the sample.
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What sets this technique apart is its ability to deliver measurement quality comparable to traditional contact-mode AFM while extending these capabilities to delicate samples that would typically be damaged by continuous contact. This innovation bridges a critical gap in nanoscale electrical characterization, making previously challenging measurements routine and reliable.
Soft IC + PFM & Soft IC SThM
The Soft IC is also compatible with other AFM modes such as Scanning Thermal Microscopy(SThM) and Piezoresponse Force Mode (PFM) with similar benefits as Soft ResiScope, i.e. it avoids friction however it keeps the force constant during the thermal or piezoelectric measurement. It extends the capability to measure delıcate samples ın an easier and reliable manner.
Soft PFM
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Measuring amplitude and phase signals for fragile samples.
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Intermittent Contact mode + PFM
Soft SThM
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Thermal conductivity measurements for delicate samples
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Intermittent Contact mode + SThM