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Magnetic Force Microscopy (MFM) Mode
Unveiling Nanoscale Magnetic Structures
Magnetic Force Microscopy (MFM) is an Atomic Force Microscopy (AFM) technique that allows for high-resolution mapping of magnetic force gradients at the nanoscale. This mode is crucial for studying magnetic materials, data storage devices, and a wide range of magnetic phenomena.
Key Features
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High Sensitivity: Detect even the weakest magnetic domains and structures
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Excellent Spatial Resolution: Achieve lateral resolution down to 20 nm
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Non-Destructive Imaging: Ideal for studying sensitive magnetic samples
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Quantitative Measurements: Map relative strengths of magnetic fields across surfaces
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Integration with Other Modes: Combine MFM with electrical or mechanical property mapping
Cobalt Alloy Coating topography and MFM results,
Scan size 30µm x 30 µm
Magnetical Pattern, Topography and MFM results
Scan size 24 µm x 24 µm
Stainless Steel, MFM Mode
Scan size 18 µm x 18 µm​
Benefits of MFM Mode
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Superior Resolution: Our advanced MFM implementation offers unparalleled spatial resolution and sensitivity.
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User-Friendly Interface: Intuitive software makes MFM accessible to both experts and beginners.
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Versatility: Easily combine MFM with other AFM modes for comprehensive sample characterization.
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Cutting-Edge Research: Stay at the forefront of magnetic nanoscale characterization with our continuously updated technology.