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Nano-Observer One Plus
Versatile and Powerful AFM for Essential Research Needs
The Nano-Observer One Plus is a flexible and powerful Atomic Force Microscope that combines performance, ease of use, and affordability. Designed for both experienced researchers and newcomers to AFM, it offers a wide range of capabilities to meet your essential research needs.
Key Features
Wide Measurement Range:
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XY Scan Range: 100 μm × 100 μm (±10%)
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Z Range: 15 μm (±10%)
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High-resolution imaging with 24-bit control
User-Friendly Design
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Compact AFM head with pre-positioned tip system
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Top and side views for easy tip/sample positioning
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Intuitive software for quick and safe AFM acquisitions
Multiple AFM Modes:
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Contact/LFM and Oscillating/Phase imaging
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Advanced modes for mechanical, electrical, and magnetic characterization
HD-KFM Mode
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High-definition Kelvin Force Microscopy for surface potential mapping
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Enhanced sensitivity and resolution compared to standard KFM
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Graphene Monolayers
20x20 µm scan
ResiScope
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Wide-range resistance measurements from 10² to 10¹² ohms
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Ideal for conductive, semiconductor and isolant materials
Solid State Battery
Conductivity Levels
60x60 µm
Why Choose Nano-Observer One Plus?
Versatility: Wide range of modes and measurements for diverse research needs
User-Friendly: Intuitive software and design for both beginners and experienced users
Performance: Achieve high-resolution imaging and precise measurements
Affordable: Advanced AFM capabilities at a competitive point
Expandable: Compatible with various environmental control options
Electric Field Microscopy (EFM) is an oscillating mode. A metal tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of the interactions with the gradient of electrical forces present on the surface
Force modulation mode is a mode of contact AFM. A mechanical oscillation is applied to the tip during the scan. A map of mechanical properties is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.
Magnetic Field Microscopy (MFM) is an oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of interaction with the magnetic forces on the surface.
Piezo Force Microscopy (PFM) is a AFM contact mode. An electrical oscillation is applied to the conductive tip during scanning. Mapping piezoelectric orientation areas is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.
Conductive AFM (C-AFM) is an AFM contact mode. A conductive tip saves the current variations of the surface using an amplifier. Curves of current / voltage can be conducted at various locations on the sample.
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AFM MODES
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