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force modulation afm mode results

Force Modulation Mode (FMM)
Mapping Nanoscale Mechanical Properties

Force Modulation Mode (FMM) is an advanced Atomic Force Microscopy (AFM) technique that allows for high-resolution mapping of mechanical properties at the nanoscale. This powerful mode is crucial for studying materials with nonuniform mechanical characteristics, making it especially valuable in materials science and polymer research.

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Key Features

  • High Sensitivity: Detect subtle variations in mechanical properties across sample surfaces

  • Excellent Spatial Resolution: Achieve lateral resolution down to nanometer scale

  • Quantitative Measurements: Map relative differences in elastic modulus and viscoelasticity

  • Wide Dynamic Range: Suitable for a broad spectrum of materials, from soft polymers to rigid composites

  • Integration with Other Modes: Combine FMM with electrical or thermal property mapping for comprehensive analysis

Force Modulation Mode

Superior Resolution:
Our advanced FMM implementation offers unparalleled spatial resolution and sensitivity.
User-Friendly Interface:
Intuitive software makes FMM accessible to both experts and beginners.
Versatility:
Easily combine FMM with other AFM modes for comprehensive sample characterization.
Cutting-Edge Research:
Stay at the forefront of nanomechanical characterization with our continuously updated technology.

force modulation afm results

Block Polymer,

Scan size 50µm x 50 µm

force modulation afm mode results

Carbon Fibers in Epoxy,

Scan size 30 µm x 30 µm

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