Application fields

Force Modulation Mode (FMM)
Mapping Nanoscale Mechanical Properties

Force Modulation Mode (FMM) is an advanced Atomic Force Microscopy (AFM) technique that allows for high-resolution mapping of mechanical properties at the nanoscale. This powerful mode is crucial for studying materials with nonuniform mechanical characteristics, making it especially valuable in materials science and polymer research.

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Key Features

Constant Contact: The tip remains in constant contact with the sample surface.
Mechanical Oscillation: A small, high-frequency mechanical oscillation is applied to the cantilever or sample.
Amplitude and Phase Detection: The system measures the amplitude and phase of the cantilever's response to this oscillation.
Data Interpretation: Changes in amplitude and phase correlate to local variations in sample stiffness and viscoelastic properties.

This technique allows simultaneous acquisition of topography and mechanical property data, providing a comprehensive view of the sample's surface characteristics.

High Sensitivity: Detect subtle variations in mechanical properties across sample surfaces
Excellent Spatial Resolution: Achieve lateral resolution down to nanometer scale
Quantitative Measurements: Map relative differences in elastic modulus and viscoelasticity
Wide Dynamic Range: Suitable for a broad spectrum of materials, from soft polymers to rigid composites
Integration with Other Modes: Combine FMM with electrical or thermal property mapping for comprehensive analysis

Black Polymer,

Scan size 50µm x 50 µm