ResiScope™ III is an advanced module for Atomic Force Microscopy (AFM) that enables high-precision electrical measurements at the nanoscale. Here's an overview of its working principle:

1. Conductive Probe:
   A conductive AFM tip is used to scan the sample surface.
   The tip acts as one electrode, while the sample acts as the other.

2. Voltage Application:
   A DC bias voltage is applied between the tip and the sample.

3. Current Measurement:
   As the tip scans across the surface, it measures the current flowing between the tip and the sample. The current range can be from 100 fA to 1 mA.

4. Resistance Calculation:
   Using the applied voltage and measured current, the system calculates the local resistance. The resistance range covered is from 10² to 10¹² ohms.

5. Fast Auto-Ranging:
   A fast processor-driven auto-ranging system allows for real-time adjustment of the measurement range. This enables accurate measurements across a wide range of conductivities without manual intervention.

6. Current Limit-Protective Resistance:
   Current limitation helps to minimize undesired current-related effects like local oxidation or bimetallic effect.

7. Simultaneous Resistance/Current/Topography:
   While measuring the topography, the system simultaneously captures resistance and current data. This enables comprehensive correlation between physical and electrical properties.

8. Compatible with All AFM Modes:
   ResiScope III is compatible with all AFM modes such as EFM/MFM and standard KFM. Notably compatible with: PFM/ResiScope simultaneously to define real piezo/ferroelectric domains. Contact mode, oscillating modes, and Soft-IC mode for quantitative electrical measurements on soft samples

9. Data Processing and Visualization:
   The collected data is processed in real-time to create high-resolution maps of current and resistance. These maps can be overlaid with topography data for integrated analysis.

10. Environmental Control:
    Measurements can be performed in air, controlled atmospheres, and with temperature control.
    Advanced capabilities demonstrated in applications like VO₂ under temperature variation.
    The unique design of ResiScope III allows for unprecedented sensitivity and range in electrical measurements, making it a powerful tool for nanoscale electrical characterization across a wide range of materials and applications.

ResiScope III vs. C-AFM

• Unrivaled Dynamic Range: ResiScope III offers the highest dynamic range of electrical measurements (100 fA to 1 mA) in a single module, eliminating the need for multiple instruments or sample changes.

• Enhanced Sensitivity: High sensitivity across the entire measurement range with:

  • No capacitive effects

  • No saturation of the preamplifiers

  • Accurate characterization from highly conductive to near-insulating materials

• Advanced Versatility:

  • Full compatibility with all AFM modes (EFM/MFM, KFM)

  • Simultaneous PFM/ResiScope measurements for piezo/ferroelectric domain analysis

  • Advanced oscillating modes and Soft-IC mode capabilities

  • Enhanced temperature control features

• Sample Preservation:

  • Current limiting protective resistance

  • Minimizes local oxidation effects

  • Prevents bimetallic effects

  • Protects delicate or valuable specimens

• Comprehensive Data Collection:

  • Simultaneous mapping of resistance, current, and topography

  • Enhanced correlation between physical and electrical properties

  • Real-time visualization of multiple parameters

• Environmental Adaptability:

  • Operation in air and controlled atmospheres

  • Temperature-controlled measurements

  • Demonstrated capabilities with temperature-sensitive materials (e.g., VO₂)