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Piezoresponse Force Microscopy (PFM)
Nanoscale Electromechanical Properties
Piezoresponse Force Microscopy (PFM) is an Atomic Force Microscopy (AFM) technique that allows for the visualization and manipulation of electromechanical coupling at the nanoscale. This powerful mode is crucial for studying piezoelectric and ferroelectric materials, offering unprecedented insights into their structure, properties, and behavior.
Key Features
Our PFM implementation offers:
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High Sensitivity: Detect even the smallest piezoelectric responses
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Dual-Frequency Mode: Simultaneously map topography and piezoresponse
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Vector PFM: Measure both vertical and lateral piezoresponse components
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Spectroscopy Capabilities: Perform local hysteresis measurements
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Integration with Other Modes: Combine PFM with conductivity or mechanical property mapping
Piezoresponse Force Microscopy
Piezoresponse Force Microscopy mode (PFM) PZT sample, Topography & phase signal, Scan size :10µm
Topography
PFM Mode
Phase Signal
Superior Resolution
Our advanced PFM implementation offers unparalleled spatial resolution.
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User-Friendly Interface
Intuitive software makes PFM accessible to both experts and beginners.
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Versatility
Easily combine PFM with other AFM modes for comprehensive sample characterization.
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