NanoMechanical Mode

Force Modulation Mode (FMM)

Mapping Nanoscale Mechanical Properties

Force Modulation Mode (FMM) is an advanced Atomic Force Microscopy (AFM) technique that allows for high-resolution mapping of mechanical properties at the nanoscale. This powerful mode is crucial for studying materials with nonuniform mechanical characteristics, making it especially valuable in materials science and polymer research.

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force modulation afm mode results

Application fields

Materials Science
Polymers
Semiconductors
2D Materials
Biology
Energy Materials

Key Features

Force Modulation Mode

  • High Sensitivity: Detect subtle variations in mechanical properties across sample surfaces
  • Excellent Spatial Resolution: Achieve lateral resolution down to nanometer scale
  • Quantitative Measurements: Map relative differences in elastic modulus and viscoelasticity
  • Wide Dynamic Range: Suitable for a broad spectrum of materials, from soft polymers to rigid composites
  • Integration with Other Modes: Combine FMM with electrical or thermal property mapping for comprehensive analysis

Force Modulation Mode

Superior Resolution:
Our advanced FMM implementation offers unparalleled spatial resolution and sensitivity.
User-Friendly Interface:
Intuitive software makes FMM accessible to both experts and beginners.
Versatility:
Easily combine FMM with other AFM modes for comprehensive sample characterization.
Cutting-Edge Research:
Stay at the forefront of nanomechanical characterization with our continuously updated technology.

force modulation afm results
Block Polymer,
Scan size 50µm x 50 µm
force modulation afm mode results

Carbon Fibers in Epoxy,

Scan size 30 µm x 30 µm

How does Force Modulation Mode work?

  1. Constant Contact: The tip remains in constant contact with the sample surface.
  2. Mechanical Oscillation: A small, high-frequency mechanical oscillation is applied to the cantilever or sample.
  3. Amplitude and Phase Detection: The system measures the amplitude and phase of the cantilever’s response to this oscillation.
  4. Data Interpretation: Changes in amplitude and phase correlate to local variations in sample stiffness and viscoelastic properties.
how does force modulation mode work
This technique allows simultaneous acquisition of topography and mechanical property data, providing a comprehensive view of the sample’s surface characteristics.

Specifications

  • Oscillation Frequency Range: 1 kHz – 100 kHz
  • Amplitude Resolution: < 0.1 nm
  • Phase Resolution: < 0.1°
  • Compatible with all CSInstruments AFM systems
  • Optional: Advanced spectroscopy module for quantitative mechanical property mapping

Questions about Force Modulation Mode?

Ask the application scientists behind our AFMs and modes — about your samples, probes, set-up or which mode fits your measurement. We answer every message personally.