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Expand Your Research Horizons
Whether you’re exploring material properties, analyzing electrical characteristics, or investigating biological samples, our diverse selection of AFM modes and accessories offers the tools you need to push the boundaries of nanoscale research.
Advanced Modes
From high-definition Kelvin Probe Force Microscopy (HD-KFM) and ResiScope™ resistance and current mapping to innovative Soft Interaction Control (Soft IC) mode, our advanced AFM modes enable precise measurements and imaging across a wide range of applications.
Specialized Accessories
Complement your AFM system with our carefully curated accessories, including environmental control modules, liquid cells, and specialized probes, to tailor your setup for specific research requirements.
Explore our offerings below to find the perfect combination of modes and accessories to elevate your AFM experiments and achieve groundbreaking results in your field.
AFM Systems
AFM Modes
Electrical Modes (DC) Specialty
- ResiScope™ IIIAdvanced resistance measurements across wide ranges.
- Soft ResiScope™Optimized for delicate sample resistance mapping.
- ResiScope™ IIUltra-wide resistance range for the Nano-Observer I.
- Conductive AFMConductivity mapping of materials.
- Scanning Microwave ImpedanceMeasures dielectric properties at nanoscale.
Electrical Modes (AC) Specialty
- HD-KFM™ IIIAdvanced work function and surface potential mapping.
- HD-KFM™ ISingle-pass Kelvin probe force microscopy for the Nano-Observer I.
- Kelvin Force MicroscopyMaps electrostatic properties of materials.
- Electrostatic Force MicroscopyMeasures surface charges and dielectric properties.
- Piezo Response Force MicroscopyStudies electromechanical properties.
Imaging Modes
NanoMechanical Modes
- Soft MEKAStiffness and adhesion maps with no shear on soft samples.
- Force ModulationMeasures mechanical properties by modulating surface forces.
- Phase (AC Mech. Contrast)Analyzes material properties through phase imaging.
- Nano-IndentationMeasures hardness and mechanical resistance.
- Force SpectroscopyQuantifies force-distance curves for materials.
- Friction (LFM)Maps lateral friction forces.