Electrical Mode (AC)

Electrostatic Force Microscopy (EFM)

Unveiling Nanoscale Electric Field Distributions

Electric Force Microscopy (EFM) is an advanced Atomic Force Microscopy (AFM) technique that allows for high-resolution mapping of electric field gradients at the nanoscale. This powerful mode is crucial for studying a wide range of materials and devices, offering unprecedented insights into their electrical properties and behavior.

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Electrical force microscopy scan result

Application fields

Materials Science
Polymers
Semiconductors
2D Materials
Biology
Energy Materials

Key Features

EFM Mode

  • High Sensitivity: Detect even the smallest variations in electric field gradients
  • Excellent Spatial Resolution: Achieve lateral resolution down to a few nanometers
  • Non-Destructive Imaging: Ideal for delicate or sensitive samples
  • Quantitative Measurements: Map relative strengths of electric fields across surfaces
  • Integration with Other Modes: Combine EFM with topography, mechanical, or other electrical modes for comprehensive analysis

EFM Mode

Electrical force microscopy scan result

2 Nanotubes network deposited between 2 electrodes, EFM mode, 65µm scan

Electrical force microscopy scan result

Graphene Scan Result with EFM 10 µm scan

  • Superior Resolution: Our advanced EFM implementation offers unparalleled spatial resolution and sensitivity.
  • User-Friendly Interface: Intuitive software makes EFM accessible to both experts and beginners.
  • Versatility: Easily combine EFM with other AFM modes for comprehensive sample characterization.
  • Cutting-Edge Research: Stay at the forefront of nanoscale electrical characterization with our continuously updated technology.
Nano Observer II Advanced AFM
See alsoNano-Observer IIMore details about the modes

How does EFM work?

  1. Topography Scan: A metal-coated tip first scans the surface to record topography.
  2. Lift Mode: The tip is then raised to a specific height above the sample.
  3. Electric Field Detection: As the tip moves across the surface, it detects the gradient of electrical forces present.
  4. Data Recording: The system records the phase shifts of the cantilever oscillation, which correspond to the electric field gradient.

This two-pass technique allows for separate optimization of topographical and electrical measurements, ensuring high-quality data for both.

How does the Electrical Force Microscopy Mode work?

Specifications

  • Lift Height Range: 5 nm – 100 nm (typical)
  • Lateral Resolution: < 20 nm (tip-dependent)
  • Compatible with all CSInstruments AFM systems
  • Optional: Advanced EFM modules for quantitative measurements

Application Fields

Materials Science

  • Characterization of dielectric thin films
  • Study of charge distribution in composite materials
  • Investigation of ferroelectric domain structures

Electronic Materials

  • Failure analysis in microelectronic devices
  • Detection and mapping of trapped charges
  • Characterization of semiconductor dopant distributions

Life Sciences

  • Study of charge distributions in biological membranes
  • Investigation of electrical properties of biomaterials

Polymer Science

  • Analysis of charge accumulation and dissipation in polymers
  • Characterization of piezoelectric polymers

Nanotechnology

  • Electrical characterization of nanomaterials (e.g., carbon nanotubes, graphene)
  • Development and optimization of nanoelectronic devices

Questions about EFM Mode?

Ask the application scientists behind our AFMs and modes — about your samples, probes, set-up or which mode fits your measurement. We answer every message personally.