AFM Application Notes

Welcome to the CSInstruments Application Notes library, your resource for advanced nanoscale characterization. This collection features in-depth case studies demonstrating how our Nano-Observer AFM series tackles today's most pressing research challenges. Explore key fields including Energy Materials, 2D Materials, Semiconductors, Polymers, and Biological Samples. Each note is a practical guide, showing how to obtain a complete picture of your sample by correlating surface topography with critical electrical and mechanical properties. Dive in to find solutions and inspiration for your own research.

Solar Energy

Nanoscale Electrical Characterization of Photovoltaic Materials

Discover how to overcome the limitations of conventional AFM in solar cell research. This application note details how HD-KFM™, ResiScope™, and Soft IC™ modes provide a complete solution for artifact-free conductivity mapping, high-resolution surface potential analysis, and non-destructive characterization.

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Unlocking Solid-State Battery Performance with ResiScope™ & HD-KFM™

Unlocking Solid-State Battery Performance with ResiScope™ & HD-KFM™

This note details how to overcome the limitations of conventional AFM for characterizing solid-state polymer batteries. Learn how the synergistic combination of Soft ResiScope™ and HD-KFM™ provides a complete, non-destructive analysis of critical electrical properties.

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2D Materials: Graphene, hBN & MoS₂

2D Materials: Graphene, hBN & MoS₂

Explore how HD-KFM and ResiScope™ on the Nano-Observer AFM reveal layer-dependent work function, moiré superlattice charge modulation, and conductivity in graphene, hBN, and MoS₂ — from ~100 nm triangular domains to monolayer-by-monolayer electronic structure mapping.

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SRAM topography and HD-KFM surface potential

Electrical AFM of Semiconductor Devices

HD-KFM™ and ResiScope™ on the same SRAM area, a silicon dopant staircase from 100 Ω to 1 MΩ, and Soft ResiScope™ on VO₂ during heating.

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MFM under in-plane field variation

Magnetic Domains Under an Applied Field

MFM with the Variable Magnetic Field Module: domain rotation from 50 to 470 G and field steps within one scan, in plane and out of plane, without sample heating.

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PDMS Soft MEKA modulus map

Nanomechanical Mapping of Polymers

Phase imaging, force modulation and Soft MEKA: from morphology to quantitative Young’s modulus and adhesion maps, plus in-situ crystallization.

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