Nanoscale Electrical Characterization of Photovoltaic Materials
Discover how to overcome the limitations of conventional AFM in solar cell research. This application note details how HD-KFM™, ResiScope™, and Soft IC™ modes provide a complete solution for artifact-free conductivity mapping, high-resolution surface potential analysis, and non-destructive characterization.
Solid-State Battery Performance with ResiScope™ & HD-KFM™
This note details how to overcome the limitations of conventional AFM for characterizing solid-state polymer batteries. Learn how the synergistic combination of Soft ResiScope™ and HD-KFM™ provides a complete, non-destructive analysis of critical electrical properties.
2D Materials: Graphene, hBN & MoS₂
Explore how HD-KFM and ResiScope™ on the Nano-Observer AFM reveal layer-dependent work function, moiré superlattice charge modulation, and conductivity in graphene, hBN, and MoS₂, from ~100 nm triangular domains to monolayer-by-monolayer electronic structure mapping.
Electrical AFM of Semiconductor Devices
HD-KFM™ and ResiScope™ on the same SRAM area, a silicon dopant staircase from 100 Ω to 1 MΩ, and Soft ResiScope™ on VO₂ during heating.
Magnetic Domains Under an Applied Field
MFM with the Variable Magnetic Field Module: domain rotation from 50 to 470 G and field steps within one scan, in plane and out of plane, without sample heating.
Nanomechanical Mapping of Polymers
Phase imaging, force modulation and Soft MEKA: from morphology to quantitative Young’s modulus and adhesion maps, plus in-situ crystallization.
Application articles
More on AFM applications
Shorter overviews of what electrical and mechanical AFM modes show in solar cells, batteries and 2D materials.
Nanoscale AFM Characterization Techniques for Next-Generation Solar Cells
Explore HD-KFM™, ResiScope™, and Soft IC Mode for characterizing organic and perovskite solar cells. Discover how nanoscale AFM analysis accelerates photovoltaic innovation.
Read more: Nanoscale AFM Characterization Techniques for Next-Generation Solar Cells
How HD-KFM Characterizes 2D Materials at the Nanoscale
Discover how High-Definition Kelvin Probe Force Microscopy (HD-KFM) characterizes graphene, MoS₂, and hBN at the atomic scale. Learn about advanced AFM techniques for materials science.
Read more: How HD-KFM Characterizes 2D Materials at the Nanoscale
Advancing Battery Technology with Atomic Force Microscopy: Insights at the Nanoscale
Uncover the secrets of battery materials at the nanoscale with Atomic Force Microscopy. Learn how CSInstruments' AFM solutions are advancing battery technology.
Read more: Advancing Battery Technology with Atomic Force Microscopy: Insights at the NanoscaleGuides
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