Application fields
Key Features
Nano-Observer One Plus
Wide Measurement Range:
- XY Scan Range: 100 μm × 100 μm (±10%)
- Z Range: 15 μm (±10%)
- High-resolution imaging with 24-bit control
User-Friendly Design
- Compact AFM head with pre-positioned tip system
- Top and side views for easy tip/sample positioning
- Intuitive software for quick and safe AFM acquisitions
Multiple AFM Modes:
- Contact/LFM and Oscillating/Phase imaging
- Advanced modes for mechanical, electrical, and magnetic characterization
HD-KFM Mode
- High-definition Kelvin Force Microscopy for surface potential mapping
- Enhanced sensitivity and resolution compared to standard KFM
ResiScope
- Wide-range resistance measurements from 10² to 10¹² ohms
- Ideal for conductive, semiconductor and isolant materials
20x20 µm scan
Conductivity Levels
60x60 µm
Modes
Specifications
Scanner Specifications
- XY Scan Range: 100 μm × 100 μm (±10%)
- Z Range: 15 μm (±10%)
Optical Detection System
- Laser Type: Low noise laser diode
- Detector: 4-quadrant photodiode
Imaging Modes
- Contact Mode
- Lateral Force Microscopy (LFM)
- Tapping Mode (Amplitude Modulation)
- Phase Imaging
- Non-Contact Mode
- HD-KFM I (High Definition Kelvin Force Microscopy)
- ResiScope II (Resistance Mapping)
- Electric Field Microscopy (EFM)
- Magnetic Force Microscopy (MFM)
- Conductive AFM (C-AFM)
- Force Modulation Microscopy
- Piezoresponse Force Microscopy (PFM)
Electrical Measurements
- ResiScope II Range: 10² to 10¹² ohms
- Voltage Range: ±10 V (adjustable)
Controller and Data Acquisition
- Controller Resolution: 24-bit
- Built-in Lock-in Amplifier: Up to 6 MHz
- Maximum Data Points: 4096 × 4096
- Scanning Speed: Up to 8 lines/second (in 256 × 256 pixels)
Environmental Control (Optional)
- Temperature Range: -40°C to 450°C (with optional heating/cooling stage)
- Humidity Control: Optional, range dependent on specific module
- Liquid Cell: Available for imaging in fluid environments
Software
- Operating System Compatibility: Windows 10 & 11
- Real-time Data Processing and Display
- Multiple Channel Data Acquisition
- Force Curve Analysis Tools
Accessories
- Various cantilevers and probes for different modes
- Liquid cell holder
- Temperature control module (optional)
- Environmental control chamber (optional)
Note: Specifications are subject to change. For the most up-to-date information or for advanced features like dC/dZ measurements, enhanced PFM capabilities, or faster IV measurements, please inquire about our Nano-Observer II model or contact CSInstruments directly.
Why choose the Nano-Observer One Plus?
Versatility
Wide range of modes and measurements for diverse research needs
User-Friendly
Intuitive software and design for both beginners and experienced users
Performance
Achieve high-resolution imaging and precise measurements
Affordable
Advanced AFM capabilities at a competitive price
Expandable
Compatible with various environmental control options
Beyond imaging
More modes on the Nano-Observer One Plus
Besides HD-KFM™ and ResiScope™, the One Plus runs the standard electrical, magnetic and mechanical AFM modes.
Electric Force Microscopy (EFM)
An oscillating mode. A metal tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of the interactions with the gradient of electrical forces present on the surface
Magnetic Force Microscopy (MFM)
An oscillating mode. A magnetic tip scans the surface to record the topography. Then, the tip is over the sample and recording the offsets of the phase signal of interaction with the magnetic forces on the surface.
Conductive AFM (C-AFM)
An AFM contact mode. A conductive tip saves the current variations of the surface using an amplifier. Curves of current / voltage can be conducted at various locations on the sample.
Force Modulation
A mode of contact AFM. A mechanical oscillation is applied to the tip during the scan. A map of mechanical properties is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.
Piezoresponse Force Microscopy (PFM)
An AFM contact mode. An electrical oscillation is applied to the conductive tip during scanning. Mapping piezoelectric orientation areas is carried out by measuring the amplitude of oscillation and the offsets of the phase signal.
Questions about the Nano-Observer One Plus?
Ask the application scientists behind our AFMs and modes — about your samples, probes, set-up or which mode fits your measurement. We answer every message personally.