Imaging Mode The 3rd AFM mode

Soft Interaction Control (Soft IC) Mode

Precision for Delicate Samples

Soft Interaction Control (Soft IC) Mode combines the advantages of Resonant Mode and Contact Mode in a single solution. This innovative technique provides accurate topography measurements while protecting both sample and tip from damage.

Soft Interaction Control

The switch happens mid-scan

On a battery electrode, the scan changes from contact ResiScope to Soft Interaction Control halfway through — Soft IC improves the measurement without scratching the surface.

  • No shear on the particle, no scratching
  • Structure inside the particle becomes readable
  • Resistance — 314 kΩ to 902 GΩ

Application fields

Key Features

Soft IC mode

Contact-mode control, resonant-mode gentleness

In Soft Interaction Control the tip touches the surface once per point with a force set directly through the cantilever deflection, then lifts away before moving on. The force is known and identical at every point, and no lateral force is applied to the sample.

  • Direct force control: one parameter, the deflection; the force follows from Hooke’s law
  • No friction or shear: the tip is never dragged across the surface
  • Less damage, longer tip life: soft, sticky and loosely bound samples stay intact
  • Quantitative channels: topography, stiffness, adhesion and electrical signals from the same touch
Soft ResiScope™ on VO₂ — topography and resistance, 10 µm

Compared with contact mode

  • No lateral forces
  • Less sample damage
  • Longer tip lifetime

Compared with resonant (tapping) mode

  • Force controlled directly, with a single parameter
  • Force calculated directly, not inferred from an amplitude
  • More straightforward operation
PDMS in Soft IC mode: topography, adhesion and Young’s modulus, 90 µm
PDMS, 90 µm, Soft IC — topography, adhesion and Young’s modulus (1.2 to 10 MPa); the same mode carries Soft ResiScope™, Soft SThM and Soft PFM.

How it works

Four steps at every point

  1. Topography and stiffness — the tip approaches and touches the surface; height and contact stiffness are recorded.
  2. Constant force — the same maximum force at every point makes the measurements quantitative.
  3. Adhesion — on retraction, the pull-off force is measured.
  4. Next point — the tip lifts clear of the surface and moves on without any lateral force.

Electrical, piezoelectric and thermal measurements are made during the contact: Soft ResiScope™, C-AFM, PFM and SThM all run in Soft IC, and Soft MEKA turns the force curves into stiffness, adhesion and Young’s modulus maps.

Soft Interaction Control principle: approach, contact at constant force, adhesion on retraction, move to the next point
Soft IC in liquidApproach, scan, retract, next point. No lateral friction.

Soft Modes

Adhesion and stiffness — PDMS 90 µm and PS/PMMA 50 µm scans
Adhesion and stiffness — PDMS 90 µm and PS/PMMA 50 µm scans

Soft MEKA

Mechanical Properties Analysis:

  • Extension of Soft IC mode for precise mechanical measurements
  • High-resolution mapping capabilities
  • Specially designed for soft/fragile samples

Key Capabilities:

  • Precise stiffness mapping
  • Detailed adhesion measurements
  • Force curve analysisMechanical property extraction

Soft MEKA in detail →

Soft ResiScope™ and HD-KFM on the same area of a polymer battery electrode
Soft ResiScope™ and HD-KFM on the same area of a polymer battery electrode

Soft ResiScope

Resistance & Current Analysis:

  • Non-destructive measurements on fragile and soft conductive samples
  • Resistance from 10² to 10¹² ohms
  • No friction — prevents sample damage and tip wear
  • Constant force for quantitative electrical measurements

Soft ResiScope™ in detail →

Piezoresponse — PZT sample, 10 µm
Piezoresponse — PZT sample, 10 µm

Soft PFM

Piezoelectric Measurements:

  • High-sensitivity piezoresponse detection
  • Local polarization mapping
  • Domain structure analysis
  • Minimal sample perturbation

Key Benefits:

  • Enhanced sensitivity for weak piezoresponse
  • Reduced tip and sample wear
  • Better signal-to-noise ratio
  • Compatible with sensitive materials

PFM in detail →

Topography & thermal conductivity — carbon fiber / epoxy composite
Topography & thermal conductivity — carbon fiber / epoxy composite

Soft SThM

Thermal Analysis Features:

  • Temperature mapping with nanoscale resolution
  • Local thermal analysis
  • Minimal thermal perturbation

Applications:

  • Polymer characterization
  • Thermal interface materials
  • Microelectronics inspection
  • Biological samples

SThM in detail →

Results

Soft ResiScope™ — carbon nanotubes embedded in a polymer matrix

Product note

Soft Interaction Control product note

Principle, key specifications and application examples in one technical document. We send it to you by e-mail.

Request the product note

FAQ

Frequently Asked Questions

What is Soft Interaction Control (Soft IC) in AFM?

Soft Interaction Control is the intermittent-contact mode of the Nano-Observer AFMs. At every point the tip touches the surface with a force set directly through the cantilever deflection, then lifts away before moving to the next point. It combines the direct force control of contact mode with the absence of friction of resonant (tapping) mode.

How is Soft IC different from tapping mode?

In resonant (tapping) mode the force is controlled indirectly, through the oscillation amplitude. Soft IC controls it directly with one parameter, the deflection, so the force is known and the same at every point. That makes mechanical and electrical measurements quantitative while still avoiding lateral forces.

Which measurements can be made in Soft IC?

Topography, stiffness, adhesion and Young’s modulus (Soft MEKA), resistance and current (Soft ResiScope), conductive AFM, piezoresponse (Soft PFM) and thermal properties (Soft SThM).

Which samples benefit from Soft IC?

Soft, sticky, fragile or loosely attached samples that contact mode would damage or drag: polymers, organic electronics, battery electrodes, nanotubes and particles, and biological samples.

Questions about Soft IC mode?

Ask the application scientists behind our AFMs and modes — about your samples, probes, set-up or which mode fits your measurement. We answer every message personally.