Magnetic Mode (AC)

Variable Magnetic Field Module (VMFM)

Advanced Magnetic Characterization at the Nanoscale

The Variable Magnetic Field Module (VMFM) represents the pinnacle of magnetic characterization in Atomic Force Microscopy (AFM). By combining high-resolution Magnetic Force Microscopy (MFM) with an innovative in-plane magnetic field generator, VMFM enables dynamic studies of magnetic phenomena at the nanoscale, opening new frontiers in materials science and data storage research.

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Two field configurations

In-plane or out-of-plane magnetic field

The VMFM applies a variable magnetic field to the sample while it is imaged in MFM mode — out-of-plane or in-plane, depending on how the two magnetic rods are placed.

Out-of-plane field — One arm below, one above — the field crosses the sample out of its plane.
VMFM out-of-plane field on the Nano-Observer: the magnetic rod stands vertically at the sample

Out-of-plane field

One arm below, one above — the field crosses the sample out of its plane.

In-plane field — Both arms to the side — the sample sits in the gap and the field lies in its plane (0 – 3000 G).
VMFM in-plane field on the Nano-Observer: two magnetic rods face each other across the sample

In-plane field

Both arms to the side — the sample sits in the gap and the field lies in its plane (0 – 3000 G).

Structures under a varying field — MFM of magnetic structures from 50 to 470 gauss, 3 µm scan.

Measurement

Structures under a varying field

MFM of magnetic structures from 50 to 470 gauss, 3 µm scan.

Field variation during a scan

MFM images of a thin magnetic coating on silicon, recorded while the field was changed during the scan. Each region of the MFM image is labelled with the field it was scanned at, with the out-of-plane and the in-plane field option.

AFM scan of a thin magnetic coating on Si: topography and MFM signal while the out-of-plane field changes, 10 µm

Out-of-plane field variation

Thin magnetic coating on Si, MFM with the out-of-plane field option. Left: topography. Right: MFM signal; the field was changed during the scan and each region is labelled with its field. Scan size: 10 µm.

  • Upper half: 300 G
  • Lower half: 0 G
AFM scan of a thin magnetic coating on Si: topography and MFM signal while the in-plane field changes, 5 µm

In-plane field variation

Thin magnetic coating on Si, MFM with the in-plane field option. Left: topography. Right: MFM signal; the field was changed during the scan and each region is labelled with its field. Scan size: 5 µm.

  • Top: 250 G
  • Middle: 125 G
  • Bottom: 0 G

Application fields

Data Storage Technology

  • Study magnetic recording media under varying field conditions
  • Investigate domain wall motion in next-generation storage devices
  • Optimize magnetic bit patterns for increased data density

Materials Science

  • Characterize novel magnetic materials and nanostructures
  • Analyze magnetization reversal processes in thin films
  • Study magnetic phase transitions and domain dynamics

Semiconductor Industry

  • Evaluate magnetic properties of spintronic devices
  • Investigate magnetic sensors and MEMS devices
  • Perform failure analysis on magnetic components

Fundamental Physics

  • Explore magnetization dynamics at the nanoscale
  • Study topological magnetic structures like skyrmions
  • Investigate magnetoelectric coupling in multiferroic materials

Key Features

  • Dynamic Magnetic Imaging: Observe real-time changes in magnetic domains
  • In-Plane Magnetic Field: Generate controlled magnetic fields up to 3000 Gauss
  • No Sample Heating: Unique design eliminates current-induced heating
  • High Resolution: Maintain nanoscale imaging capabilities during field application
  • In situ Control: Adjust magnetic field strength and direction during experiments
  • Seamless Integration: Designed for compatibility with Nano-Observer AFM systems
magnetic force microscopy with magnetic field
VMFM System

Sample : Magnetic triangles structures

Scan size : 6µm

Mode : MFM

Environment : VMFM

Benefits of VMFM

  1. Advanced Magnetic Studies: Perform dynamic magnetic characterization impossible with standard MFM
  2. Non-Invasive Analysis: No current-induced sample heating, preserving sensitive samples
  3. High Resolution: Maintain nanoscale imaging capabilities under applied magnetic fields
  4. Versatile Applications: Adapt to a wide range of magnetic materials and research questions
  5. User-Friendly Operation: Intuitive control of magnetic field parameters during experiments
Nano Observer II Advanced AFM
See alsoNano-Observer IIMore details about the modes

Questions about the Variable Magnetic Field Module?

Ask the application scientists behind our AFMs and modes — about your samples, probes, set-up or which mode fits your measurement. We answer every message personally.