Halide Perovskites
Halide perovskite films are soft, sensitive to moisture and to the tip, and their performance depends on what happens at grain boundaries and interfaces. Electrical AFM maps those boundaries directly: surface potential and work… AFM for halide perovskites →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| MAPbI₃ (methylammonium lead iodide)MAPI · MAPbI3 · CH3NH3PbI3 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| CsPbBr₃CsPbBr3 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| 2D / quasi-2D perovskites2D · quasi-2D perovskites | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| PbI₂PbI2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Lead-free perovskites (Sn, double perovskites)Sn · double perovskites · Lead-free perovskites | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Mixed-cation perovskites (Cs/FA/MA)FA · MA · Cs | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| FAPbI₃ (formamidinium lead iodide)FAPbI3 · formamidinium · formamidinium lead iodide | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| CsPbI₃CsPbI3 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
2D Materials
Atomically thin flakes need nanoscale electrical contrast without damaging the layer. Layer number, doping and stacking show up in the surface potential, while ResiScope™ III maps conductivity across flakes, edges and contacts. AFM for 2d materials →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| Graphenegraphene | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| MoS₂MoS2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Hexagonal boron nitride (hBN)hBN · h-BN · boron nitride | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Van der Waals heterostructures | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| WS₂WS2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| WSe₂WSe2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| MXenes (Ti₃C₂ …)MXene · Ti3C2 · MXenes | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Twisted / moiré bilayersTwisted · moiré bilayers | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) · Conductivity on soft or fragile samples | ResiScope™ III HD-KFM™ III Soft ResiScope™ |
| MoSe₂MoSe2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| InSe / GaSeGaSe · InSe | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| MoTe₂MoTe2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| SnS₂ / SnSe₂SnS2 · SnSe2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| ReS₂ / ReSe₂ReS2 · ReSe2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Black phosphorusphosphorene · black phosphorus | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| PdSe₂PdSe2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Bi₂O₂SeBi2O2Se | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| WTe₂WTe2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
Wide-Bandgap & III-V Semiconductors
GaN, SiC, Ga₂O₃, GaAs, InP and related devices are defined by doping, junctions and interfaces at the nanometre scale. ResiScope™ III maps resistance over ten decades in one scan, the measurement usually done by… AFM for wide-bandgap & iii-v semiconductors →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| GaN | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
| SiC | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| Diamonddiamond | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
| GaAs / AlGaAsGaAs · AlGaAs | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| AlGaN / GaN HEMTsHEMT · AlGaN · GaN HEMTs | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
| AlN | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
| Ga₂O₃Ga2O3 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| InAs / InGaAs / GaSbInAs · GaSb · InGaAs | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| InP | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| InGaN | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
Silicon & Semiconductor Devices
From dopant profiles to FinFET and power-device cross-sections, ResiScope™ III resolves resistance over ten decades in one scan, the measurement usually done by SSRM or C-AFM, and HD-KFM™ III adds the surface potential across… AFM for silicon & semiconductor devices →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| Siliconsilicon · Si wafer | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| FinFET / nanosheet / advanced CMOSFinFET · nanosheet · advanced CMOS | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| Dopant / junction profilingDopant · junction profiling | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
| Power devices (IGBT, MOSFET)IGBT · MOSFET · Power devices | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| SiGe / GeGe · SiGe | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
Metal Oxides & Photocatalysts
Oxide semiconductors and photocatalysts (TiO₂, ZnO, g-C₃N₄, BiVO₄, bismuth oxyhalides and their heterojunctions) are judged by how charges separate and move between phases. Surface potential maps with HD-KFM™ III show band alignment and charge… AFM for metal oxides & photocatalysts →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| TiO₂TiO2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| ZnO | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| g-C₃N₄ (carbon nitride)C3N4 · g-C3N4 · carbon nitride | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| In₂O₃ / ITO / IGZOITO · IGZO · In2O3 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| SrTiO₃SrTiO3 | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
| CdS | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| Bismuth oxyhalides (BiOBr, BiOCl, BiOI)BiOI · BiOBr · BiOCl | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| NiO | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| CuO / Cu₂OCuO · Cu2O | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| SnO₂SnO2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| BiVO₄BiVO4 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| WO₃WO3 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| ZnIn₂S₄ZnIn2S4 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| MoO₃MoO3 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| LaAlO₃/SrTiO₃ interfacesLaAlO3 · SrTiO3 interfaces | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
| Fe₂O₃ / Fe₃O₄Fe3O4 · Fe2O3 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| VO₂VO2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| CeO₂CeO2 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| Bi₂WO₆ / Bi₂MoO₆Bi2WO6 · Bi2MoO6 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
Ferroelectrics & Multiferroics
Ferroelectric, piezoelectric and multiferroic materials are mapped domain by domain: PFM images the polarisation, HD-KFM™ III the surface charge and potential, and ResiScope™ III the local conduction. AFM for ferroelectrics & multiferroics →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| BaTiO₃BaTiO3 | Piezo & ferroelectric domains (PFM) · Surface potential, work function (KPFM) | PFM HD-KFM™ III |
| PVDF (piezo polymer)PVDF · piezo polymer | Piezo & ferroelectric domains (PFM) · Surface potential, work function (KPFM) | PFM HD-KFM™ III |
| BiFeO₃BiFeO3 | Piezo & ferroelectric domains (PFM) · Surface potential, work function (KPFM) | PFM HD-KFM™ III |
| HfO₂ / HZO ferroelectricsHZO · HfO2 · hafnia | Piezo & ferroelectric domains (PFM) · Surface potential, work function (KPFM) | PFM HD-KFM™ III |
| PZT (lead zirconate titanate)PZT · lead zirconate titanate | Piezo & ferroelectric domains (PFM) · Surface potential, work function (KPFM) | PFM HD-KFM™ III |
| PbTiO₃PbTiO3 | Piezo & ferroelectric domains (PFM) · Surface potential, work function (KPFM) | PFM HD-KFM™ III |
| KNN / NaNbO₃KNN · NaNbO3 | Piezo & ferroelectric domains (PFM) · Surface potential, work function (KPFM) | PFM HD-KFM™ III |
| Hexagonal manganites (ErMnO₃ …)ErMnO3 · Hexagonal manganites | Piezo & ferroelectric domains (PFM) · Surface potential, work function (KPFM) | PFM HD-KFM™ III |
| LiNbO₃ / LiTaO₃LiTaO3 · LiNbO3 | Piezo & ferroelectric domains (PFM) · Surface potential, work function (KPFM) | PFM HD-KFM™ III |
| In₂Se₃In2Se3 | Piezo & ferroelectric domains (PFM) · Surface potential, work function (KPFM) | PFM HD-KFM™ III |
| CuInP₂S₆CuInP2S6 | Piezo & ferroelectric domains (PFM) · Surface potential, work function (KPFM) | PFM HD-KFM™ III |
Thin-Film & Organic Photovoltaics
Thin-film and organic solar cells (CdTe, CIGS, CZTS, Sb₂Se₃, organic and tandem cells) depend on grain boundaries, interfaces and contacts. HD-KFM™ III maps surface potential and work function, ResiScope™ III the local current, and… AFM for thin-film & organic photovoltaics →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| Organic solar cells | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Silicon solar cells (PERC, TOPCon, HJT)HJT · PERC · TOPCon | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| CIGS (Cu(In,Ga)Se₂)CIGS · Cu(In · GaSe2) | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| CdTe | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| CZTS / CZTSSeCZTS · CZTSSe | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Tandem solar cells | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Sb₂Se₃ / Sb₂S₃Sb2S3 · Sb2Se3 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
Organic Semiconductors & Polymers
Organic semiconductors, conducting polymers and self-assembled monolayers are soft and easily damaged by a contact tip. Soft ResiScope™ maps their conductivity with controlled force, HD-KFM™ III the surface potential, and Soft MEKA the mechanical… AFM for organic semiconductors & polymers →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| Polymer blends & composites | Stiffness, adhesion, modulus · Conductivity on soft or fragile samples · Surface potential, work function (KPFM) | Soft MEKA Soft ResiScope™ HD-KFM™ III |
| Self-assembled monolayers | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| PEDOT:PSSPEDOT | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) · Conductivity on soft or fragile samples | ResiScope™ III HD-KFM™ III Soft ResiScope™ |
| PCBM / fullerenesPCBM · fullerenes | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Conjugated polymers | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Organic field-effect transistors | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| P3HT | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Pentacene / small-molecule OSCsPentacene · small-molecule OSCs | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
Battery & Energy-Storage Materials
Electrodes, solid electrolytes and interphases mix conductive and insulating phases. ResiScope™ III maps conductivity across that whole range in one scan, Soft ResiScope™ protects soft binders and coatings, and HD-KFM™ III maps the surface… AFM for battery & energy-storage materials →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| Solid electrolytes (LLZO, sulfides…)LLZO · Li6PS5Cl · sulfides | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Layered oxide cathodes (NMC, NCA, LiCoO₂)NCA · NMC · NCM | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) · Conductivity on soft or fragile samples | ResiScope™ III HD-KFM™ III Soft ResiScope™ |
| Supercapacitors | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Lithium-metal anodes | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Solid–electrolyte interphase (SEI)SEI · Solid–electrolyte interphase | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) · Conductivity on soft or fragile samples | ResiScope™ III HD-KFM™ III Soft ResiScope™ |
| LiFePO₄LiFePO4 | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Conductivity on soft or fragile samples | HD-KFM™ III ResiScope™ III Soft ResiScope™ |
| Silicon / graphite anodesSilicon · graphite anodes | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) · Conductivity on soft or fragile samples | ResiScope™ III HD-KFM™ III Soft ResiScope™ |
Metals, Alloys & Corrosion
For alloys, steels and coatings, surface potential maps (scanning Kelvin probe, SKPM) show the potential differences between phases, inclusions and intermetallic particles that drive local corrosion. HD-KFM™ III measures them together with the topography. AFM for metals, alloys & corrosion →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| Steels (stainless, duplex)steel · duplex · Steels | Surface potential, work function (KPFM) | HD-KFM™ III |
| Gold / silver nanostructures (plasmonics)Gold · plasmonics · silver nanostructures | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| Copper & copper alloys | Surface potential, work function (KPFM) | HD-KFM™ III |
| Aluminium alloysaluminum alloy · aluminium alloy | Surface potential, work function (KPFM) | HD-KFM™ III |
| Magnesium alloysMg alloy · magnesium alloy | Surface potential, work function (KPFM) | HD-KFM™ III |
| Nickel & cobalt superalloys | Surface potential, work function (KPFM) | HD-KFM™ III |
| Titanium alloys (Ti-6Al-4V)Ti6Al4V · Ti-6Al-4V · titanium alloy | Surface potential, work function (KPFM) | HD-KFM™ III |
Dielectrics & Resistive Switching
Resistive switching, memristors, gate oxides and charge-trapping layers are studied through local current. ResiScope™ III follows filaments and breakdown spots from low leakage to conductive paths, and HD-KFM™ III maps trapped charge. AFM for dielectrics & resistive switching →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| Resistive switching / memristorsRRAM · ReRAM · memristor | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
| Charge trapping & electrets | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| Alkali halides & insulators (NaCl, KBr)KBr · NaCl · Alkali halides & insulators | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| HfO₂ (dielectric / RRAM)RRAM · HfO2 · dielectric | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
| High-k dielectrics & gate oxides | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
| Ta₂O₅ / TaOxTaOx · Ta2O5 | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
Carbon Nanomaterials
Carbon nanotubes, graphene oxide and carbon films range from insulating to metallic. ResiScope™ III maps that conductivity and HD-KFM™ III the surface potential and doping. AFM for carbon nanomaterials →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| Carbon nanotubesCNT · nanotubes · carbon nanotube | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| Graphene oxide / rGOGO · rGO · graphene oxide | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
| Carbon fibres & amorphous carbon | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
Quantum Dots & Nanowires
Quantum dots, nanowires and nanoparticles are measured one object at a time. Soft Interaction Control images them gently, while HD-KFM™ III and ResiScope™ III map potential and current on single particles and wires. AFM for quantum dots & nanowires →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| Nanowiresnanowire | Current & resistance (C-AFM, SSRM) · Surface potential, work function (KPFM) | ResiScope™ III HD-KFM™ III |
| Quantum dotsQDs · quantum dot | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) | HD-KFM™ III ResiScope™ III |
Topological & Magnetic Materials
Topological insulators, 2D magnets and correlated oxides combine electrical and magnetic contrast. MFM and the Variable Magnetic Field Module image magnetic domains under an applied field, HD-KFM™ III and ResiScope™ III the electrical side,… AFM for topological & magnetic materials →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| Topological insulators (Bi₂Se₃, Bi₂Te₃)Bi2Se3 · Bi2Te3 · topological insulator | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Magnetic domains (MFM) | HD-KFM™ III ResiScope™ III MFM |
| Manganites & correlated oxides | Surface potential, work function (KPFM) · Current & resistance (C-AFM, SSRM) · Magnetic domains (MFM) | HD-KFM™ III ResiScope™ III MFM |
| MnBi₂Te₄MnBi2Te4 | Magnetic domains (MFM) · Domains under an applied field · Surface potential, work function (KPFM) | MFM Variable Magnetic Field HD-KFM™ III |
| 2D magnets (CrI₃, CrSBr, Fe₃GeTe₂…)CrI3 · CrSBr · Fe3GeTe2 | Magnetic domains (MFM) · Domains under an applied field · Surface potential, work function (KPFM) | MFM Variable Magnetic Field HD-KFM™ III |
Biological & Soft Matter
Cells, biomolecules, lipid membranes and hydrogels are imaged in liquid with the EZ Liquids fluid cell, gently with Soft Interaction Control, and mechanically with Soft MEKA. AFM for biological & soft matter →
| Material | What to measure | Nano-Observer modes |
|---|---|---|
| Proteins, DNA & biomoleculesDNA · protein · peptide | Imaging in liquid · Stiffness, adhesion, modulus · Gentle topography | EZ Liquids Soft MEKA Soft Interaction Control |
| Cells & bacteriacells · bacteria · living cells | Imaging in liquid · Stiffness, adhesion, modulus · Gentle topography | EZ Liquids Soft MEKA Soft Interaction Control |
| Hydrogels & soft polymers | Imaging in liquid · Stiffness, adhesion, modulus · Gentle topography | EZ Liquids Soft MEKA Soft Interaction Control |
| Lipid membraneslipid · membrane | Imaging in liquid · Stiffness, adhesion, modulus · Gentle topography | EZ Liquids Soft MEKA Soft Interaction Control |
No material matches. Tell us about your sample and we will suggest the right mode.