Scanning Thermal Microscopy (SThM)

Nanoscale thermal analysis and conductivity mapping with AFM

Advanced Thermal Characterization at the Nanoscale Thermal measurements AFM combines atomic force microscopy with thermal analysis capabilities, enabling precise measurement of thermal properties at the nanometer scale. Our systems offer two primary modes: thermal analysis for phase transition measurements and Scanning Thermal Microscopy (SThM) for thermal conductivity mapping.

Application fields

Key Features

SThM

<50 nm Thermal Spatial Resolution: Up to 20 nm precision for detailed thermal mapping
0.01°C Sensitivity: Exceptional temperature detection accuracy
Temperature Measurements up to 400°C: Wide operational temperature range
Thermal Conductivity Mapping: Comprehensive thermal property visualization

Principle of Operation

The probe mounted on a dedicated support is moved to the point selected and placed on the surface of the sample. Then the temperature of the tip is ramped linearly with time while the degree of bending is monitored. At the point of phase transition, the material beneath the tip softens and the probe penetrates into the sample, this provides the nanoscale equivalent of a bulk thermo-mechanical analysis experiment whereby you can measure the phase transition temperatures of the sample such as Tg or Tm.

Battery analysis AFM — Topography & thermal conductivity on carbon fiber/epoxy composite

Specifications

Specifications:

Spatial Resolution: <50 nm (up to 20 nm achievable)
Temperature Sensitivity: 0.01°C
Operating Temperature Range: Up to 700°C
Measurement Types: Thermal conductivity, temperature mapping, Tg/Tm analysis
Sample Compatibility: Various materials including polymers, composites, and advanced materials

Questions about the SThM module?

Ask the application scientists behind our AFMs and modes — about your samples, probes, set-up or which mode fits your measurement. We answer every message personally.