Imaging Mode

Contact Mode AFM

Fundamental Imaging for Nanoscale Discovery

Contact Mode is one of the foundational techniques in Atomic Force Microscopy (AFM), offering high-resolution imaging and force measurement capabilities. In this mode, a nanometric probe maintains constant contact with the sample surface, providing direct topographical information and friction data.

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Contact Mode AFM

Application fields

Materials Science
Polymers
Semiconductors
2D Materials
Biology
Energy Materials

Key Features

Contact Mode

  • High Resolution: Achieve atomic-scale imaging on suitable samples.
  • Direct Force Measurement: Quantitative analysis of tip-sample interactions.
  • Versatility: Compatible with various sample types and environments.
  • Simultaneous Data Acquisition: Collect topography and friction data in a single scan.
  • Established Technique: Well-understood methodology with extensive literature support.

Contact Mode AFM

Force Curves

Perform precise force-distance measurements to study:

  • Adhesion forces
  • Material elasticity
  • Surface energy

Friction Analysis

Utilize Lateral Force Microscopy (LFM) to investigate:

  • Nanoscale tribology
  • Surface lubrication
  • Material homogeneity

Environmental Control

Conduct experiments in various conditions:

  • Controlled atmosphere
  • Liquid environments
  • Temperature variations
Bambu fibres AFM
Fibre Sample
Hexagonal Structures AFM
Hexagonal Structures
Si sample afm
Si Sample
Si Sample AFM
Si Sample

How does Contact Mode AFM work?

  1. Probe-Surface Interaction: A sharp tip attached to a cantilever is brought into direct contact with the sample surface.
  2. Constant Force: As the tip scans across the surface, a feedback loop maintains a constant cantilever deflection, ensuring consistent contact force.
  3. Laser Detection: A laser beam reflected off the cantilever’s back detects minute changes in its deflection.
  4. Topography Mapping: Vertical movements of the piezoelectric scanner, adjusted to maintain constant deflection, are recorded to create a topographical map.
  5. Friction Measurement: Torsional movements of the cantilever provide information about surface friction (Lateral Force Microscopy – LFM).
How does Contact Mode AFM work

Questions about Contact Mode?

Ask the application scientists behind our AFMs and modes — about your samples, probes, set-up or which mode fits your measurement. We answer every message personally.