Electrical Mode (DC)

Soft ResiScope™

True Quantitative Resistance/Current Measurements with Intermittent Contact

Soft ResiScope™ is an innovative AFM mode that enables true quantitative resistance and current measurements on soft and fragile conductive samples. This unique technology combines the benefits of intermittent contact modes with the precision of ResiScope measurements, opening new possibilities for electrical characterization of sensitive materials.

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Soft Interaction Control

The switch happens mid-scan

On a battery electrode, the scan changes from contact ResiScope to Soft Interaction Control halfway through — Soft IC improves the measurement without scratching the surface.

  • No shear on the particle, no scratching
  • Structure inside the particle becomes readable
  • Resistance — 314 kΩ to 902 GΩ

Application fields

Materials Science
Polymers
Semiconductors
2D Materials
Biology
Energy Materials

Key Features

Soft ResiScope

  • Non-Destructive Measurements: Ideal for fragile and soft conductive samples
  • Wide Measurement Range: Resistance from 10² to 10¹² ohms
  • No Friction: Prevents sample damage and tip wear
  • Constant Force: Ensures quantitative electrical measurements
  • Intermittent Contact: Optimizes electrical measurement while preserving tip and sample integrity
Soft ResiScope™ on VO₂ — topography and resistance, 10 µm

Soft Intermittent Contact : The 3rd AFM mode

  • Combines precision of contact AFM with dynamic capabilities of resonant modes
  • Ideal for delicate and soft materials
  • Detailed mechanical and electrical measurements with minimal sample disturbance
  • \1, Soft PFM, Soft ResiScope and Soft SThM
Adhesion Stiffness analysis with AFM

Soft IC Mode

  • Adhesion
  • Stiffness
  • Young’s Modulus

Soft ResiScope

  • Integrates intermittent contact AFM with detailed resistance and current mapping
  • Wide range of resistance measurements (10² to 10¹² ohms)
  • Excellent for fragile conductive samples and advanced material studies
Mechanical analysis of sample with AFM

Gallery

ResiScope™ results

P3HT (organic PV cell)
P3HT (organic PV cell)Soft ResiScope · 3 µmSoft ResiScope · 3 µm scan
Oxide film (1x1 µm)
Oxide film1×1 µmOxide film grown on stainless steel · Scan Size:1×1 micron
SIC Doping Profiling (Doping test sample used by semiconductor industry to improve doping…)
SIC Doping ProfilingDoping test sample used by semiconductor industry to improve doping…Doping test sample used by semiconductor industry to improve doping concentration process.
Batteries (80 µm)
Batteries80 µmSample: Polymer Battery Scan size: 80 microns
Semiconductors/microelectronics
Semiconductors/microelectronicsSample: Sram 50 microns
Solar Cell (2µm)
Solar Cell2µmPerovskite Solar cell (2µm scan)
2D Materials (Graphene oxide on Gold substrate)
2D MaterialsGraphene oxide on Gold substrate

How does Soft ResiScope work?

Soft ResiScope operates on an intermittent contact principle:

  1. The AFM probe makes brief, controlled contact with the sample
  2. During contact, a constant force is applied, allowing precise resistance and current measurements
  3. The tip is then retracted and moved to the next measurement point
  4. This cycle repeats, creating a comprehensive map of electrical properties without damaging the sample
Soft ResiScope operates on an intermittent contact principle: – Soft ResiScope™

Specifications

  • Measurement Range: 10² to 10¹² ohms
  • Compatibility: Nano-Observer AFM systems
  • Supported Modes: Intermittent contact
  • Data Output: Simultaneous topography and electrical property mapping

Quantitative Measurements

Resistance signal, 5μm scan, Soft ResiScope mode
Ultrathin granular gold layer evaporated on a doped-Si substrate — Resistance signal, 5μm scan

Soft ResiScope provides quantitative measurements comparable to standard ResiScope in contact mode:

  • Identical Results: Topography and resistance signals match between Soft ResiScope and contact mode ResiScope on standard electrical samples (e.g., SRAM)
  • High Resolution: Maintains lateral resolution while ensuring quantitative measurements

Advantages Over Traditional Methods

Soft ResiScope vs. Standard ResiScope

Soft ResiScope vs ResiScope
Section comparison

Soft ResiScope vs. Oscillating/Contact Modes

  • Sample Preservation: Prevents surface damage common in contact mode
  • Equivalent Results: Produces data comparable to oscillating mode on fragile samples
  • Versatility: Suitable for a wide range of materials, from polymers to biological samples

Questions about Soft ResiScope™?

Ask the application scientists behind our AFMs and modes — about your samples, probes, set-up or which mode fits your measurement. We answer every message personally.