Electrical AFM
HD-KFM™
Kelvin probe force microscopy in single pass: surface potential and work function mapped together with topography, at high sensitivity and resolution.
ResiScope™
Resistance and current over 10 decades in one scan — 10²–10¹² Ω and fA to µA, where standard C-AFM covers about four.
Soft Interaction Control
Soft IC imaging
Combines the advantages of Resonant Mode and Contact Mode: accurate topography while protecting both the sample and the tip.
Soft MEKA
A complete force curve at every point: topography, adhesion and stiffness from the same scan, without dragging soft or sticky samples.
Magnetic fields and existing AFMs
Variable Magnetic Field Module
MFM under an applied magnetic field, in-plane or out-of-plane, changed during the scan to follow magnetic domains as the field varies.
Galaxy Dual Controller
Replaces the controller, the electronics and the software of MultiMode, Dimension, Agilent and Keysight AFMs: every mode is kept, and HD-KFM™, ResiScope™ and Soft IC are added.
Our story with atomic force microscopy began in 1989 — read it on the company page.
See it on your own sample
Send us a few details about your material: we recommend the mode that fits and can run a test measurement.