AFM Application Notes

Welcome to the CSInstruments Application Notes library, your resource for advanced nanoscale characterization. This collection features in-depth case studies demonstrating how our Nano-Observer AFM series tackles today's most pressing research challenges. Explore key fields including Energy Materials, 2D Materials, Semiconductors, Magnetic Materials and Polymers. Each note is a practical guide, showing how to obtain a complete picture of your sample by correlating surface topography with critical electrical and mechanical properties. Dive in to find solutions and inspiration for your own research.

Perovskite solar cell: AFM topography and electrical map

Nanoscale Electrical Characterization of Photovoltaic Materials

Discover how to overcome the limitations of conventional AFM in solar cell research. This application note details how HD-KFM™, ResiScope™, and Soft IC™ modes provide a complete solution for artifact-free conductivity mapping, high-resolution surface potential analysis, and non-destructive characterization.

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ResiScope current map of a battery electrode

Unlocking Solid-State Battery Performance with ResiScope™ & HD-KFM™

This note details how to overcome the limitations of conventional AFM for characterizing solid-state polymer batteries. Learn how the synergistic combination of Soft ResiScope™ and HD-KFM™ provides a complete, non-destructive analysis of critical electrical properties.

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Graphene topography and HD-KFM surface potential

2D Materials: Graphene, hBN & MoS₂

Explore how HD-KFM and ResiScope™ on the Nano-Observer AFM reveal layer-dependent work function, moiré superlattice charge modulation, and conductivity in graphene, hBN, and MoS₂ — from ~100 nm triangular domains to monolayer-by-monolayer electronic structure mapping.

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SRAM topography and HD-KFM surface potential

Electrical AFM of Semiconductor Devices

HD-KFM™ and ResiScope™ on the same SRAM area, a silicon dopant staircase from 100 Ω to 1 MΩ, and Soft ResiScope™ on VO₂ during heating.

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MFM under in-plane field variation

Magnetic Domains Under an Applied Field

MFM with the Variable Magnetic Field Module: domain rotation from 50 to 470 G and field steps within one scan, in plane and out of plane, without sample heating.

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PDMS Soft MEKA modulus map

Nanomechanical Mapping of Polymers

Phase imaging, force modulation and Soft MEKA: from morphology to quantitative Young’s modulus and adhesion maps, plus in-situ crystallization.

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Application articles

More on AFM applications

Shorter overviews of what electrical and mechanical AFM modes show in solar cells, batteries and 2D materials.

Guides

Choosing a mode or a measurement

How to choose the right AFM modeFrom the property you need to measure to the mode.Single-pass vs lift-mode KPFMResolution, crosstalk and when each is the right choice.Surface roughness with AFMRa, Rq and what affects the numbers.Which AFM probe for which modeProbe guide by mode.

News

News & research highlights

News & Research HighlightsProduct news, customer upgrade stories and published research.