Cantilevers (AFM Tips)

Cantilevers (AFM Probes)

CSInstruments is proud to be an authorized reseller of high-quality AFM cantilevers and probes from industry-leading manufacturers Vmicro and AppNano. Our comprehensive selection ensures that you'll find the perfect cantilever for your specific AFM application and research needs.

To view our complete cantilever and probe listings or to place an order, please contact our sales team through the form below. Our experts will be happy to assist you in selecting the right product for your specific AFM requirements.

Probe selection guide

Which AFM probe for which mode?

An AFM probe is chosen from the mode first, then from the sample. Three properties decide: the spring constant (high for hard tapping, low for soft samples, contact mode and liquid), the resonance frequency (higher allows faster scanning in tapping mode) and the coating or tip material (magnetic for MFM, metal or conductive diamond for electrical modes). The table gives the starting point; nominal values come from the AppNano tables below.

Mode or sampleProbe familiesNominal k, fWhy
Tapping / non-contact (standard)ACT, ACTA · ACL, ACLA · ACCESS-NCACT 37 N/m, 300 kHz · ACL 58 N/m, 190 kHz · ACCESS-NC 93 N/m, 320 kHzHigh spring constant for hard tapping (high force). ACT's high frequency allows faster scanning; ACL's medium frequency helps phase imaging. Vmicro silicon probes for standard tapping are listed below.
Higher-resolution tappingACT-SS, ACL-SS, FORT-SS (Super-Sharp)same cantilevers as the standard modelsSuper-Sharp silicon tips for non-contact, tapping, intermittent and close-contact imaging, for enhanced resolution.
Medium-force tappingACST, ACSTA7.8 N/m, 150 kHzMedium spring constant for medium tapping force at fast scanning speeds.
Soft samples, liquid, force modulationFORT, FORTA · ACCESS-FM · FM60FORT 1.6 N/m, 61 kHz · ACCESS-FM 2.7 N/m, 60 kHzLow spring constant and low frequency for soft tapping (low force), soft samples and measurements in liquid; FM60 for force modulation in air or liquid. Vmicro probes for soft tapping and force modulation are listed below.
Contact modeSICON · SHOCON · CM12, CM28SICON 0.29 N/m, 15 kHz · SHOCON 0.14 N/m, 21 kHzSoft cantilevers for contact-mode imaging; CM12 and CM28 are sharp silicon probes for contact mode in air or liquid.
Soft materials, several forces on one chipHYDRA-ALLfour silicon nitride cantileversFour triangular silicon nitride cantilevers of different spring constants on one chip, designed for soft materials.
MFM (magnetic)MAGT · MAGT-LM · MAGT-HM3 N/m, 62 kHzCr/Co magnetic coating with medium coercivity; low-moment (LM), medium (MAGT) and high-moment (HM) versions to match the MFM requirement.
EFM and KPFM / KFMANSCM-PT · ACCESS-EFM · Vmicro Pt-coatedANSCM-PT 3 N/m, 60 kHzPt/Ir coating on both sides of the cantilever; ANSCM is designed for EFM and KFM and can also be used in C-AFM. Pt-coated Vmicro probes are for EFM, KPFM and s-SNOM.
C-AFM, ResiScope™, PFMDD-ACTA · DD-FORTA · CS-A-E2.8, CS-A-E40 · CS-A-FMC, CS-A-NCCDD-ACTA 40 N/m, 300 kHz · DD-FORTA 3 N/m, 62 kHzBoron-doped, highly conducting diamond on the tip side. DD-ACTA: ResiScope, conductive and PFM modes. DD-FORTA: ResiScope and Soft ResiScope, conductive, PFM, KFM and EFM. CS-A diamond probes are conductive and wear-resistant.
Rough samples and narrow trenchesHART (high aspect ratio) · Vmicro long-tip probesHART 40 N/m, 300 kHzHigh-aspect-ratio and long, tapered tips for narrow trenches and high-roughness samples.
Seeing the tip on the sampleACCESS-C, ACCESS-NC, ACCESS-FM—The tip is visible from above, for applications that need to see it as it engages the surface.
sMIMsMIM probes50 nm tip radiusShielded MEMS probes with a centre transmission line, specific to sMIM — see the sMIM page.

Many models are available with or without an aluminium backside coating, and in boxes of 10, 20 or 50. Not sure which probe fits your sample and AFM? Ask us — we help select the probe as well as supply it.

AFM Probe  AppNano
AFM Probe  Vmicro
AFM Probe - Cantilever Vmicro
Prices:
Box of 10 cantilevers = 280€
Box of 20 cantilevers = 500€
Box of 50 cantilevers = 1150€

Unique advantages:

  • Tapered Streamlined Long Tip
  • Vertical sidewall chip for safe handling
  • Tip view

Applications

  • Standard tapping mode
  • Compatible for narrow trenches or high roughness samples imaging
AFM Probe - Cantilever Vmicro
Prices:
Box of 10 cantilevers = 280€
Box of 20 cantilevers = 500€
Box of 50 cantilevers = 1150€

Unique advantages:

  • Tapered Streamlined Long Tip
  • Vertical sidewall chip for safe handling
  • Tip view

Applications

  • Standard tapping mode
  • Compatible for narrow trenches or high roughness samples imaging
  • Olympus AC160 characteristics
AFM Probe - Cantilever Vmicro
Prices:
Box of 10 cantilevers = 280€
Box of 20 cantilevers = 500€
Box of 50 cantilevers = 1150€

Unique advantages:

  • Tapered Streamlined Long Tip
  • Vertical sidewall chip for safe handling
  • Tip view

Applications

  • Soft tapping mode / Force modulation mode
  • Compatible for narrow trenches or high roughness samples imaging
AFM Probe - Cantilever Vmicro
Prices:
Box of 10 cantilevers = 350€
Box of 20 cantilevers = 640€
Box of 50 cantilevers = 1450€

Unique advantages:

  • Tapered Streamlined Long Tip
  • Vertical sidewall chip for safe handling
  • Tip view

Applications

  • Electrical modes EFM, KPFM
  • s-SNOM (scattering-type Scanning Near-field Optical Microscopy)
AFM Probe - Cantilever Vmicro
Prices:
Box of 10 cantilevers = 350€
Box of 20 cantilevers = 640€
Box of 50 cantilevers = 1450€

Unique advantages:

  • Tapered Streamlined Long Tip
  • Vertical sidewall chip for safe handling
  • Tip view

Applications

  • Electrical modes EFM, KPFM
  • s-SNOM (scattering-type Scanning Near-field Optical Microscopy)
AFM Probe - Cantilever Vmicro
Prices:
Box of 10 cantilevers = 350€
Box of 20 cantilevers = 640€
Box of 50 cantilevers = 1450€

Unique advantages:

  • Tapered Streamlined Long Tip
  • Vertical sidewall chip for safe handling
  • Tip view

Applications

  • Electrical modes EFM, KPFM
  • s-SNOM (scattering-type Scanning Near-field Optical Microscopy)

FAQ

Frequently Asked Questions

Which AFM probe should I use for tapping mode?

For standard tapping in air, stiff silicon probes such as ACT (37 N/m, 300 kHz) or ACL (58 N/m, 190 kHz): ACT's high frequency allows faster scanning, ACL helps phase imaging. Super-Sharp (-SS) versions give enhanced resolution. For soft samples, use a lower spring constant such as FORT (1.6 N/m).

Which probe is used for conductive AFM, ResiScope or PFM?

A conductive tip. Boron-doped diamond probes (DD-ACTA, DD-FORTA) are highly conducting and wear-resistant: DD-ACTA for ResiScope, conductive and PFM modes, DD-FORTA also for Soft ResiScope, KFM and EFM. Pt/Ir-coated ANSCM probes can also be used in C-AFM.

Which probe for KPFM / KFM and EFM?

A metal-coated tip: ANSCM-PT (Pt/Ir, 3 N/m, 60 kHz) is designed for EFM and KFM; ACCESS-EFM and Pt-coated Vmicro probes are also used for EFM and KPFM. For HD-KFM, ask us for the probe matched to the mode.

Which probe for magnetic force microscopy (MFM)?

MAGT probes have a Cr/Co magnetic coating (3 N/m, 62 kHz). Choose the moment to match the sample: MAGT-LM (low moment), MAGT (medium) or MAGT-HM (high moment).

Which probe for soft samples or imaging in liquid?

Low spring constant probes: FORT/FORTA (1.6 N/m, 61 kHz) for soft tapping and liquid, ACCESS-FM (2.7 N/m), SICON or SHOCON for contact mode, or HYDRA-ALL with four silicon nitride cantilevers of different stiffness on one chip.

Are these probes compatible with AFMs from other manufacturers?

The AppNano and Vmicro probes listed here are standard-size probes; the CM, FM and TM series are described as compatible with most commercial AFMs. Tell us your AFM model and we will confirm.

How do I order AFM probes from CSInstruments?

CSInstruments is an authorized reseller of AppNano and Vmicro probes. Use the quotation form on this page with the model and the box size (10, 20 or 50 for most models); list prices are shown in the tables.