Question 1

What is the Nano-Observer II?

Accepted Answer

The Nano-Observer II is an advanced Atomic Force Microscope (AFM) manufactured by CSInstruments (France). It is designed for both expert researchers and beginners, offering a wide range of nanoscale imaging and characterization capabilities. Key differentiators include the proprietary HD-KFM III module for single-pass surface potential mapping, the ResiScope III module for 10-decade electrical measurements, and the Soft Intermittent Contact (Soft-IC) mode for non-destructive measurements on delicate samples. The system features a 24-bit Galaxy USB controller, scan range of 100 × 100 µm in XY and 15 µm in Z, and is compatible with optical techniques including UV, IR, and Raman spectroscopy.

Question 2

What AFM modes are available on the Nano-Observer II?

Accepted Answer

The Nano-Observer II supports a comprehensive set of AFM modes: standard imaging modes (Contact, Resonant, Soft Intermittent Contact); electrical AC modes (HD-KFM III, HD-KFM I, standard KFM, EFM, PFM); electrical DC modes (ResiScope III, Soft ResiScope, Conductive AFM, Scanning Microwave Impedance); nanomechanical modes (Soft MEKA, Force Modulation, Nano-Indentation, Force Spectroscopy, Friction/LFM); magnetic modes (MFM, Variable Magnetic Field Module); thermal modes (Scanning Thermal Microscopy, Peltier/Heating stages); and environmental modes (liquid cell, electrochemical cell, gas/humidity control, glove box compatibility).

Question 3

What is the scan range of the Nano-Observer II?

Accepted Answer

The Nano-Observer II has an XY scan range of 100 µm × 100 µm (±10%) and a Z range of 15 µm (±10%). XY drive resolution is 0.06 Ångströms and Z drive resolution is 0.006 Ångströms. The maximum data acquisition resolution is 8192 × 8192 points. The sample stage accepts samples up to 52 mm (2 inches) in diameter and up to 20 mm in height.

Question 4

What makes the Nano-Observer II different from competing AFM systems?

Accepted Answer

Three proprietary technologies distinguish the Nano-Observer II: (1) HD-KFM III — a single-pass Kelvin Probe Force Microscopy module operating at 0.1–0.5 nm tip-sample distance, achieving 100–10,000× greater electrostatic sensitivity than standard lift-mode KFM; (2) ResiScope III — an electrical measurement module with 10-decade dynamic range (50 fA to 1 mA, 10² to 10¹² ohms) in a single scan pass, overcoming C-AFM saturation limitations; and (3) Soft Intermittent Contact (Soft-IC) mode — a third imaging paradigm combining contact and resonant mode advantages for non-destructive measurements on soft or fragile samples. The AutoScan software with three-click operation and automated gain adjustment further lowers the barrier for non-expert users.

Question 5

Can the Nano-Observer II be used with optical microscopy techniques?

Accepted Answer

Yes. The Nano-Observer II has an open design that allows integration with optical microscopy techniques including UV, infrared (IR), and Raman spectroscopy. This enables correlated AFM and optical measurements on the same sample area, which is particularly useful for photovoltaic research, 2D material characterization, and biological imaging.

Question 6

Is the Nano-Observer II compatible with a glove box for air-sensitive samples?

Accepted Answer

Yes. The Nano-Observer II can be operated inside a glove box with controlled gas atmosphere (e.g., N₂ or Ar) and humidity control. This is essential for characterizing air-sensitive materials such as lithium metal anodes, 2D materials, organic semiconductors, and perovskite photovoltaic films that degrade upon exposure to ambient atmosphere.

Question 7

What electrical measurement capabilities does the Nano-Observer II offer?

Accepted Answer

The Nano-Observer II offers the most comprehensive electrical AFM suite in its class: AC electrical modes include HD-KFM III (single-pass surface potential, sub-nm tip distance), standard KFM (double-pass), EFM, and PFM. DC electrical modes include ResiScope III (50 fA–1 mA, 10 decades), Soft ResiScope (friction-free electrical measurement on fragile samples), Conductive AFM, and Scanning Microwave Impedance Microscopy (sMIM). The voltage range for electrical measurements is ±10 V.

Question 8

What is Soft Intermittent Contact (Soft-IC) mode on the Nano-Observer II?

Accepted Answer

Soft Intermittent Contact (Soft-IC) is CSInstruments' third AFM imaging paradigm, alongside contact and resonant modes. It operates by making controlled, brief intermittent contact with the surface using Z-piezo movement, maintaining constant force during each measurement point before retracting. This eliminates lateral friction forces that can damage soft samples or degrade tip sharpness. Soft-IC enables Soft MEKA (stiffness, adhesion, Young's modulus), Soft ResiScope (electrical mapping on fragile conductors), Soft PFM, and Soft SThM on samples that would be damaged by standard contact or resonant mode AFM.

(Cantilevers)

Nano-Observer II

Contact us